Dynamic System Reliability Modeling and Analysis of Dynamic and Dependent Behaviors资料下载.pdf
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Dynamic System Reliability Modeling and Analysis of Dynamic and Dependent Behaviors资料下载.pdf
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reliabilitymodeling;
functionalsafety;
SixSigmamethods;
lead-freeelectronics;
warrantyanalysis/management;
andriskandsafetyanalysis.WileySeriesinQualityandReliabilityEngineeringDesignforSafetybyLouisJ.Gullo,JackDixonFebruary2018NextGenerationHALTandHASS:
RobustDesignofElectronicsandSystemsbyKrikA.Gray,JohnJ.PaschkewitzMay2016ReliabilityandRiskModels:
SettingReliabilityRequirements,2ndEditionbyMichaelTodinovSeptember2015AppliedReliabilityEngineeringandRiskAnalysis:
ProbabilisticModelsandStatisticalInferenceByIliaB.Frenkel,AlexKaragrigoriou,AnatolyLisnianski,AndreV.KleynerSeptember2013DesignforReliabilitybyDevG.Raheja(Editor),LouisJ.Gullo(Editor)July2012EffectiveFMEAs:
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PrinciplesandPracticeofFailurePreventioninElectronicSystemsbyNormanPascoeApril2011ImprovingProductReliability:
StrategiesandImplementationbyMarkA.Levin,TedT.KalalMarch2003TestEngineering:
AConciseGuidetoCost-EffectiveDesign,DevelopmentandManufacturebyPatrickOConnorApril2001IntegratedCircuitFailureAnalysis:
AGuidetoPreparationTechniquesbyFriedrichBeckJanuary1998MeasurementandCalibrationRequirementsforQualityAssurancetoISO9000byAlanS.MorrisOctober1997ElectronicComponentReliability:
Fundamentals,Modeling,Evaluation,andAssurancebyFinnJensenNovember1995kkkkDynamicSystemReliabilityModelingandAnalysisofDynamicandDependentBehaviorsLiudongXingUniversityofMassachusettsDartmouth,USAGregoryLevitinTheIsraelElectricCorporationChaonanWangJinanUniversity,ChinakkkkThiseditionfirstpublished20192019JohnWiley&
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SonsLtd,TheAtrium,SouthernGate,Chichester,WestSussex,PO198SQ,UKEditorialOfficeTheAtrium,SouthernGate,Chichester,WestSussex,PO198SQ,UKFordetailsofourglobaleditorialoffices,customerservices,andmoreinformationaboutWileyproductsvisitusat.Wileyalsopublishesitsbooksinavarietyofelectronicformatsandbyprint-on-demand.Somecontentthatappearsinstandardprintversionsofthisbookmaynotbeavailableinotherformats.LimitofLiability/DisclaimerofWarrantyWhilethepublisherandauthorshaveusedtheirbesteffortsinpreparingthiswork,theymakenorepresentationsorwarrantieswithrespecttotheaccuracyorcompletenessofthecontentsofthisworkandspecificallydisclaimallwarranties,includingwithoutlimitationanyimpliedwarrantiesofmerchantabilityorfitnessforaparticularpurpose.Nowarrantymaybecreatedorextendedbysalesrepresentatives,writtensalesmaterialsorpromotionalstatementsforthiswork.Thefactthatanorganization,website,orproductisreferredtointhisworkasacitationand/orpotentialsourceoffurtherinformationdoesnotmeanthatthepublisherandauthorsendorsetheinformationorservicestheorganization,website,orproductmayprovideorrecommendationsitmaymake.Thisworkissoldwiththeunderstandingthatthepublisherisnotengagedinrenderingprofessionalservices.Theadviceandstrategiescontainedhereinmaynotbesuitableforyoursituation.Youshouldconsultwithaspecialistwhereappropriate.Further,readersshouldbeawarethatwebsiteslistedinthisworkmayhavechangedordisappearedbetweenwhenthisworkwaswrittenandwhenitisread.Neitherthepublishernorauthorsshallbeliableforanylossofprofitoranyothercommercialdamages,includingbutnotlimitedtospecial,incidental,consequential,orotherdamages.LibraryofCongressCataloging-in-PublicationDataappliedforHardback:
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sakkmesterke/ShutterstockSetin10/12ptWarnockProbySPiGlobal,Chennai,India10987654321kkkkvContentsForewordixPrefacexiNomenclaturexv1Introduction1References42FundamentalReliabilityTheory72.1BasicProbabilityConcepts72.1.1AxiomsofProbability72.1.2ConditionalProbability72.1.3TotalProbabilityLaw82.1.4BayesTheorem92.1.5RandomVariables92.2ReliabilityMeasures102.2.1TimetoFailure112.2.2FailureFunction112.2.3ReliabilityFunction112.2.4FailureRate112.2.5MeanTimetoFailure112.2.6MeanResidualLife122.3FaultTreeModeling122.3.1StaticFaultTree132.3.2DynamicFaultTree132.3.3Phased-MissionFaultTree142.3.4Multi-StateFaultTree152.4BinaryDecisionDiagram162.4.1BasicConcept172.4.2ROBDDGeneration172.4.3ROBDDEvaluation182.4.4IllustrativeExample192.5MarkovProcess202.6ReliabilitySoftware22References22kkkkviContents3ImperfectFaultCoverage273.1DifferentTypesofIPC273.2ELCModeling283.3Binary-StateSystem293.3.1BDDExpansionMethod293.3.2SimpleandEfficientAlgorithm323.4Multi-StateSystem343.4.1MMDD-BasedMethodforMSSAnalysis353.4.2IllustrativeExample363.5Phased-MissionSystem373.5.1Mini-ComponentConcept373.5.2PMSSEA383.5.3PMSBDDMethod403.5.4SummaryofPMSSEA423.5.5IllustrativeExample423.6Summary43References454ModularImperfectCoverage494.1ModularImperfectCoverageModel494.2NonrepairableHierarchicalSystem514.3RepairableHierarchicalSystem554.4Summary58References585FunctionalDependence615.1LogicORReplacementMethod615.2CombinatorialAlgorithm635.2.1Task1:
AddressingUFsofIndependentTriggerComponents635.2.2Task2:
GeneratingReducedProblemsWithoutFDEP635.2.3Task3:
SolvingReducedReliabilityProblems645.2.3.1ExpansionProcess645.2.3.2ReducedFTGenerationProcedure655.2.3.3DualTrigger-BasicEventHandling655.2.3.4EvaluationofP(systemfails|ITEi)655.2.4Task4:
IntegratingtoObtainFinalSystemUnreliability665.2.5AlgorithmSummary665.2.6AlgorithmComplexity665.3CaseStudy1:
CombinedTriggerEvent675.4CaseStudy2:
SharedDependentEvent705.5CaseStudy3:
CascadingFDEP735.5.1EvaluationofP(systemfails|ITE1)745.5.2EvaluationofP(systemfails|ITE2)755.5.3EvaluationofURsystem765.6CaseStudy4:
DualEventandCascadingFDEP765.6.1EvaluationofP(systemfails|ITE1)785.6.2EvaluationofURsystem79kkkkContentsvii5.7Summary79References806DeterministicCommon-CauseFailure836.1ExplicitMethod846.1.1Two-StepMethod846.1.2IllustrativeExample846.2EfficientDecompositionandAggregationApproach856.2.1Three-StepMethod866.2.2IllustrativeExample876.3DecisionDiagramBasedAggregationMethod896.3.1Three-StepMethod896.3.2IllustrativeExample916.4UniversalGeneratingFunctionBasedMethod946.4.1SystemModel946.4.2u-FunctionMethodforSeries-ParallelSystems956.4.3u-FunctionMethodforCCFs976.4.4IllustrativeExample996.5Summary104References1047ProbabilisticCommon-CauseFailure1077.1Single-PhaseSystem1077.1.1ExplicitMethod1087.1.2ImplicitMethod1107.1.3ComparisonsandDiscussions1157.2Multi-PhaseSystem1157.2.1ExplicitMethod1157.2.2ImplicitMethod1197.2.3ComparisonsandDiscussions1237.3ImpactofPCCF1247.4Summary125References1258DeterministicCompetingFailure1278.1Overview1278.2PFGEMethod1288.2.1s-IndependentLFandPFGE1288.2.2s-DependentLFandPFGE1288.2.3DisjointLFandPFGE1298.3Single-PhaseSystemwithSingleFDEPGroup1298.3.1CombinatorialMethod1298.3.2CaseStudy1318.4Single-PhaseSystemwithMultipleFDEPGroups1358.4.1CombinatorialMethod1358.4.2CaseStudy137kkkkviiiContents8.5Single-PhaseSystemwithPFsHavingGlobalandSelectiveEffects1418.5.1CombinatorialMethod1418.5.2CaseStudy1448.6Multi-PhaseSystemwithSingleFDEPGroup1508.6.1CombinatorialMethod1508.6.2CaseStudy1538.7Multi-PhaseSystemwithMultipleFDEPGroups1588.7.1CTMC-BasedMethod1588.7.2CaseStudy1598.8Summary166References1679ProbabilisticCompetingFailure1699.1Overview1699.2SystemwithSingleTypeofComponentLocalFailures1709.2.1CombinatorialMethod1709.2.2CaseStudy1729.3SystemwithMultipleTypesofComponentLocalFailures1819.3.1CombinatorialMethod1819.3.2CaseStudy1829.4SystemwithRandomFailurePropagationTime1909.4.1CombinatorialMethod1909.4.2CaseStudy:
WSNSystem1929.5Summary198References19910DynamicStandbySparing20110.1TypesofStandbySystems20110.2CTMC-BasedMethod20210.2.1ColdStandbySystem20310.2.2WarmStandbySystem20410.3DecisionDiagramBasedMethod20510.3.1ColdStandbySystem20510.3.2WarmStandbySystem20810.4ApproximationMethod21110.4.1HomogeneousColdStandbySystem21210.4.2HeterogeneousColdStandbySystem21410.5EventTransitionMethod21610.5.1State-SpaceRepresentationofSystemBehavior21710.5.2BasicSteps21810.5.3WarmStandbySystem21810.6OverviewofOptimizationProblems22010.7Summary222References222Index229kkkkixForewordbyDr.AndreKleyner,SeriesEditor“DynamicSystemReliability:
ModelingandAnalysisofDynamicandDependentBehaviors”byXing,LevitinandWangTheimportanceofqualityandreliabilitytoasystemcanhardlybedisputed.Productfailuresinthefieldinevitablyleadtolossesintheformofrepaircost,warrantyclaims,custo
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